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Time of Flight - Secondary Ion Mass Spectrometry

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Primary Contact:

Michael Walker

Facility RRID

RRID:SCR_022049

Facility Details

Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a highly surface-sensitive analytical technique used to obtain elemental, isotopic, and molecular information from the surface of solid materials and compacted powders.

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Services are offerred outside of

Consulting is offerred outside of Colorado School of Mines

Last Updated: 09/17/2026